Austrian Post 5.99 DPD courier 6.49 GLS courier 4.49

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Language EnglishEnglish
Book Hardback
Book Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits Sandeep K. Goel
Libristo code: 06726976
Publishers Taylor & Francis Inc, October 2013
? points 714 b
301.85 včetně DPH
50 % chance We search the world When will I receive my book?
Austria Delivery to Austria

30-day return policy


You might also be interested in


Franz Schubert Franz Schubert / Paperback
common.buy 28.78
Essentials of English Grammar Otto Jespersen / Paperback
common.buy 69.14
Israel's Reprisal Policy, 1953-1956 Ze'ev Drory / Paperback
common.buy 87.55
Revealing Moment and Other Plays Oscar W. Firkins / Paperback
common.buy 79.95

About the book

Full name Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Language English
Binding Book - Hardback
Date of issue 2013
Number of pages 259
EAN 9781439829417
ISBN 9781439829417
Libristo code 06726976
Weight 598
Dimensions 175 x 238 x 22
Give this book today
It's easy
1 Add to cart and choose Deliver as present at the checkout 2 We'll send you a voucher 3 The book will arrive at the recipient's address

Login

Log in to your account. Don't have a Libristo account? Create one now!

 
mandatory
mandatory

Don’t have an account? Discover the benefits of having a Libristo account!

With a Libristo account, you'll have everything under control.

Create a Libristo account