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Noncontact Atomic Force Microscopy
Language
English
English
Book
Paperback
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based...
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Libristo code: 06617965
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630 b
630 b
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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
About the book
Full name
Noncontact Atomic Force Microscopy
Author
E. Meyer, S. Morita, Roland Wiesendanger
Language
English
English
Binding
Book - Paperback
Date of issue
2012
Number of pages
440
EAN
9783642627729
ISBN
9783642627729
Libristo code
06617965
Weight
692
Dimensions
155 x 235 x 25
