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Metrology and Physical Mechanisms in New Generation Ionic Devices
Language
English
English
Book
Paperback
This thesis presents the first direct observations of the 3D-shape, size and electrical properties o...
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Libristo code: 19703833
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317 b
317 b
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This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
About the book
Full name
Metrology and Physical Mechanisms in New Generation Ionic Devices
Author
UMBERTO CELANO
Language
English
English
Binding
Book - Paperback
Date of issue
2018
Number of pages
175
EAN
9783319819068
ISBN
9783319819068
Libristo code
19703833
Publishers
Springer International Publishing AG
Weight
454
Dimensions
155 x 235 x 12
Categories
