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Introduction to Focused Ion Beam Nanometrology
Language
English
English
Book
Paperback
This book describes modern focused ion beam microscopes and techniques and how they can be used to a...
Libristo code: 12446872
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294 b
294 b
124.27
€
včetně DPH
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This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
About the book
Full name
Introduction to Focused Ion Beam Nanometrology
Author
David C. Cox
Language
English
English
Binding
Book - Paperback
Date of issue
2015
Number of pages
104
EAN
9781681740201
ISBN
1681740206
Libristo code
12446872
Publishers
Morgan & Claypool Publishers
Weight
178
Dimensions
253 x 178 x 8
