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Electron Beam Testing Technology

Language EnglishEnglish
Book Paperback
Book Electron Beam Testing Technology John T.L. Thong
Libristo code: 02254694
Publishers Springer-Verlag New York Inc., June 2013
This is the first comprehensive volume on electron beam testing for integrated circuits. Including i... Full description
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This is the first comprehensive volume on electron beam testing for integrated circuits. Including introductory material, a guide to fundamentals, and an implementational section, the work will serve as a complete reference for both experienced practitioners as well as those unfamiliar with the technology.

About the book

Full name Electron Beam Testing Technology
Author John T.L. Thong
Language English
Binding Book - Paperback
Date of issue 2013
Number of pages 462
EAN 9781489915245
ISBN 1489915249
Libristo code 02254694
Publishers Springer-Verlag New York Inc.
Weight 905
Dimensions 178 x 254 x 26

Categories

Mathematics & Science > Physics > Materials / States of matter > Condensed matter physics (liquid state & solid state physics)
Mathematics & Science > Chemistry > Analytical chemistry > Spectrum analysis, spectrochemistry, mass spectrometry
Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering > Electronics: circuits & components
Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering > Electronic devices & materials
Mathematics & Science > Science: general issues > Scientific equipment, experiments & techniques
Technology, Engineering, Agriculture > Energy technology & engineering > Electrical engineering
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