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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Language EnglishEnglish
Book Hardback
Book Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits Manoj Sachdev
Libristo code: 01382200
Publishers Springer-Verlag New York Inc., June 2007
The progression developed in this book is essential to understand new test methodologies, algorithms... Full description
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The progression developed in this book is essential to understand new test methodologies, algorithms and industrial practices. Without the insight into the physics of nano-metric technologies, it would be hard to develop system-level test strategies that yield a high IC fault coverage. Obviously, the work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies. Test and design practitioners from academia and industry will find that Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits lays the foundations for further pioneering work.

About the book

Full name Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Author Manoj Sachdev, José Pineda de Gyvez
Language English
Binding Book - Hardback
Date of issue 2007
Number of pages 328
EAN 9780387465463
ISBN 0387465464
Libristo code 01382200
Publishers Springer-Verlag New York Inc.
Weight 694
Dimensions 155 x 235 x 24

Categories

Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering > Electronics: circuits & components
Technology, Engineering, Agriculture > Technology: general issues > Engineering: general
Technology, Engineering, Agriculture > Technology: general issues > Technical design
Technology, Engineering, Agriculture > Energy technology & engineering > Electrical engineering
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