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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Language EnglishEnglish
Book Paperback
Book CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Andrei Pavlov
Libristo code: 01975971
Publishers Springer, October 2010
This book covers a broad range of topics related to SRAM design and testing. It includes everything...
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This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.

About the book

Full name CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Language English
Binding Book - Paperback
Date of issue 2010
Number of pages 194
EAN 9789048178551
ISBN 904817855X
Libristo code 01975971
Publishers Springer
Weight 332
Dimensions 155 x 235 x 12
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