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Characterization of Microstructures by Analytical Electron Microscopy (AEM)

Language EnglishEnglish
Book Hardback
Book Characterization of Microstructures by Analytical Electron Microscopy (AEM) Yonghua Rong
Libristo code: 01657685
Publishers Springer, Berlin, February 2011
"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic co... Full description
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"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. §The book is intended for researchers and graduate students in materials science, engineering, and condensed matter physics.§Yonghua Rong is a professor at the School of Materials Science and Engineering, Shanghai Jiao Tong University, China.

About the book

Full name Characterization of Microstructures by Analytical Electron Microscopy (AEM)
Author Yonghua Rong
Language English
Binding Book - Hardback
Date of issue 2011
Number of pages 500
EAN 9783642201189
Libristo code 01657685
Publishers Springer, Berlin
Weight 998
Dimensions 155 x 235 x 36

Categories

Technology, Engineering, Agriculture > Other technologies & applied sciences > Applied optics
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