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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

Language EnglishEnglish
Book Paperback
Book Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces Weronika Walkosz
Libristo code: 01427604
Publishers Springer-Verlag New York Inc., May 2013
This book offers results that influence many high temperature and pressure applications. It provides...
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This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.

About the book

Full name Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
Author Weronika Walkosz
Language English
Binding Book - Paperback
Date of issue 2013
Number of pages 110
EAN 9781461428572
ISBN 1461428572
Libristo code 01427604
Publishers Springer-Verlag New York Inc.
Weight 203
Dimensions 155 x 235 x 8

Categories

Mathematics & Science > Chemistry > Analytical chemistry > Spectrum analysis, spectrochemistry, mass spectrometry
Mathematics & Science > Science: general issues > Scientific equipment, experiments & techniques
Mathematics & Science > Physics > Nuclear physics
Mathematics & Science > Chemistry > Physical chemistry
Technology, Engineering, Agriculture > Industrial chemistry & manufacturing technologies > Industrial chemistry & chemical engineering
Technology, Engineering, Agriculture > Mechanical engineering & materials > Materials science
Technology, Engineering, Agriculture > Civil engineering, surveying & building > Structural engineering
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