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Atomic Force Microscopy/Scanning Tunneling Microscopy 3

Book Atomic Force Microscopy/Scanning Tunneling Microscopy 3 Samuel H. Cohen
Libristo code: 02254200
Publishers Springer-Verlag New York Inc., May 2013
This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposi... Full description
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This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.

About the book

Full name Atomic Force Microscopy/Scanning Tunneling Microscopy 3
Language English
Binding Book - Paperback
Date of issue 2013
Number of pages 210
EAN 9781475781847
ISBN 1475781849
Libristo code 02254200
Weight 426
Dimensions 178 x 254 x 13
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