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Analog IC Reliability in Nanometer CMOS

Language EnglishEnglish
Book Paperback
Book Analog IC Reliability in Nanometer CMOS Elie Maricau
Libristo code: 09479806
Publishers Springer-Verlag New York Inc., June 2015
This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical... Full description
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This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical effects resulting in unreliability, transistor aging compact models for circuit simulation, methods for efficient circuit reliability simulation and more.

About the book

Full name Analog IC Reliability in Nanometer CMOS
Author Elie Maricau, Georges Gielen
Language English
Binding Book - Paperback
Date of issue 2015
Number of pages 198
EAN 9781489986306
ISBN 1489986308
Libristo code 09479806
Publishers Springer-Verlag New York Inc.
Weight 3343
Dimensions 155 x 235 x 11

Categories

Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering > Electronics: circuits & components
Technology, Engineering, Agriculture > Technology: general issues > Engineering: general
Technology, Engineering, Agriculture > Industrial chemistry & manufacturing technologies > Other manufacturing technologies
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